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Rambler's Top100

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    Scanning Tunneling Microscopy/Spectroscopy (STM/STS) in ambient conditions and in controlled atmosphere is developed in our group during more than ten years. Few constructions of Scanning Tunneling Microscopes/Spectroscopes (STM/STS) have been designed. STM/STS investigation of the different samples including High Oriented Pyrolitical Graphite (HOPG), Langmuir-Blodgette films (LB films), fullerens and carbon nanotubes, biological molecules and membranes, and many others have been.
 


 

Ultra High Vacuum Scanning Tunneling Microscopy/Spectroscopy are in progress in our group during five years. This techniques in combination with traditional UHV investigation and sample preparation methods, such as Low Energy Electron Diffraction , Auger Electron Spectroscopy (AES) and Ion Spattering allow unique possibilities to investigate clean surfaces of metals and semiconductors single crystals and different structures on the surface.
 
 
 


 

  Ultra High Vacuum Scanning Tunneling Microscopy/Spectroscopy (UHV STM/STS) are in progress in our group during five years. This techniques in combination with traditional UHV investigation and sample preparation methods, such as Low Energy Electron Diffraction (LEED), Auger Electron Spectroscopy (AES) and Ion Spattering allow unique possibilities to investigate clean surfaces of metals and semiconductors single crystals and different structures on the surface.

 


 
 

    Atomic Force Microscopy (AFM) and Scanning Near Field Optical Microscopy (SNOM) which are developing in our group are the powerful methods for the investigation of solid state surfaces and the surface structures. AFM and SNOM techniques allow additional unique possibilities and have some advantages in respect to the traditional methods such as convenience Optical Microscopy or Scanning Electron Microscopy. We are using our selfmaked modular Scanning Probe Microscope (SPM) which can work in both AFM and SNOM modes to obtain information about the relief and the different properties of the surfaces and the surface structures of the several samples with high resolution up to the atomic scale.
 
 
 
 
 
 

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