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  Electronic Components  


SPM Research Group
Austria
  • Peter Varga (Technical University Vienna)
  •  
    Belgium
  • Chris Van Haesendonck
    (Katolieke Universiteit Leuven)
  • Victor Moshchalkov
    (Katolieke Universiteit Leuven)
  • Canada
  • Roland Bennewitz (McGill University)
  • Peter Kruse group (McMaster University)
  • Germany
  • Jurgen Behm (University of Ulm)
  • Richard Berndt (University of Kiel)
  • Gerhard Ertl (Fritz-Haber-Institute Berlin)
  • Hajo Freund (Fritz-Haber-Institute Berlin)
  • Uwe Hartmann (University of Saarbrucken)
  • Wolfgang Heckl
    (Ludwig-Maximilians-University Munchen)
  • Klaus Kern (Max-Planck-Institute for Solid State Research Stuttgart)
  • Karl-Heinz Rieder (Free University Berlin)
  • Hans-Peter Rust (Fritz-Haber-Institute Berlin)
  • Robert Schlogel (Fritz-Haber-Institute Berlin)
  • Roland Wiesendanger (University of Hamburg)
  • Othmar Marti (University of Ulm)
  • Japan  
  • M. Aono (National Institute for Materials Science)
  • Yukio Hasegawa (ISSP, University of Tokyo)
  • Toshio Sakurai (Tohoku University)
  • The Netherland
  • Joost Frenken (University of Leiden)
  • H. van Kempen (University of Nijmegen)
  • Jan van Ruitenbeek (University of Leiden)
  • Hans Niemantsverdriet
    (Eindhoven University of Technology)
  • Russian Federation  
  • Anastas A. Bukharaev
    (Zavoisky Physical-Technical Institute)
  • Andrey V. Zotov
    (Institute of Automation and Control Processes)
  • Vladimir I. Panov
    (Lomonosov Moscow State University)
  • Igor Yaminsky
    (Lomonosov Moscow State University)
  • Spain
  • Arturo M. Baro
    (Universidad Autonoma de Madrid)
  • Sweden
  • Bengt Kasemo (Chalmers University Goteborg)
  • Switzerland
  • Harald Brune
    (École Polytechnique Fédérale Lausanne)
  • Christian Felix
    (École Polytechnique Fédérale Lausanne)
  • Hans-Joachim Güntherodt (University of Basel)
  • Klaus Kern
    (École Polytechnique Fédérale Lausanne)
  • Nicholas Spencer
    (Eidgenössische Technische Hochschule Zürich)
  • United Kingdom  
  • Richard Compton (Oxford University)
  • David King (Cambridge University)
  • Meryvn Miles(University of Bristol)
  • Rasmita Raval (University of Liverpool)
  • Neville Richardson (University of St. Andrews)
  • John Weaver (University of Glasgow)
  • Mark Welland (University of Cambridge)
  • USA
  • Eric Altman (Yale University New Haven)
  • Robert Celotta (NIST Gaithersburg)
  • Don Eigler (IBM Almaden)
  • James Gimzewski
    (University of California Los Angeles)
  • Randall Feenstra (Carnegie Mellon University)
  • Wayne Goodman (University of Texas)
  • Robert Hamers (University of Wisconsin Madison)
  • K.W. Hipps (Washington State University Pullman)
  • Wilson Ho (Cornell University)
  • Stuart Lindsay (Arizona State University)
  • Chad Mirkin ( Northwestern University)
  • Calvin Quate (Stanford University)
  • Ron Reifenberger (Purdue University)
  • Miquel Salmeron (Lawrence Berkeley National Laboratory University of California)
  • Gabor Somorjai (University of California)
  • Brian Swartzentruber (Sandia National Labs Albuquerque)
  • John Venables (Arizona State University)
  • Paul Weiss (The Pennsylvania State University)
  • Robert L. Whetten (Georgia Institute of Technology)
  • George M. Whitesides (Harvard University)
  • Lloyd Whitman (Naval Research Laboratory Washington)


  • Manufactures
  • Omicron NanoTechnology™

  •    (Ultra High Vacuum SPM products)
  • Veeco - Solutions for a nanoscale world
  • Nanotec - The Nanotechnology Research Tool
  • Nanonis - SPM Controller

  •    (SPM Controller for Highest Demands)
  • NT-MDT - Scanning Probe Microscopy
  •  
  • Varian Inc. - Vacuum Technologies

  •    (Vacuum pumping solutions)
     
  • VAT - the leader in vacuum valves
  •  
  • SPECS

  •    (Systems and components for Surface Analysis)
     
  • Pfeiffer Vacuum Inc.
  •  


    SPM Software
  • Nanotec - WSxM Program

  •    (FREE Scanning Probe Microscopy Software)
  • 3D Surface Visualization Software
  • SPIP™ - The Scanning Probe Image Processor
  • Gwyddion – Free SPM data analysis software
  • FemtoScan Online - SPM Software
  • Image SXM - display and analysis of SPM     images
  • Mountains®Map SPM Image Analysis
  • ImageJ - Image Processing and Analysis
  • n-Surf - Image Processor
  •  
       


    Density functional theory
       
       
       
       


    Journals
  • Nature
  • APS Journals - American Physical Society
  • Nature Materials
  • AIP Journals - American Institute of Physics
  • Science
  • IOP Journals - Institute of Physics
  • Reviews of Modern Physics
  • Springer - Academic Journals
  •  
  • WorldScientific Journals
  •    


    Search
  • ISI Web of Knowledge
  • SCIRUS - Search for scientific information
  • SCOPUS - Basic Search
  • Scitation - AIP Journal scitation search
  • Web of Science - (Thomson Reuters)
  •  
       


    Electronic Components
  • Analog Devices, Inc.
  • ChipFind(ru) - Electronic component search
  • ARGUSSOFT - AD distributor in Russia
  • SIGNAL RECOVERY - Lock-in Amplifiers
  • Texas Instruments and Burr-Brown
  • National Semiconductor
  • ALLDATASHEET

  •    (Electronic Components Datasheet Search)
  • Digi-Key - Electronic Components Distributor
  • National Instruments - Test and Measurement
  •  
  • COMPEL - Electronic Components
  •  




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